EDP Sciences logo
Soumettre un article
rechercher
Menu
Home Tous les numéros Volume 18 (2019) HORS SÉRIE 1 J3eA, 18 (2019) 1013 References
Open Access
Issue
J3eA
Volume 18, 2019
JPCNFM 2018 – 15e journées pédagogiques du CNFM (Coordination nationale pour la formation en micro-électronique et en nanotechnologies)
Article Number 1013
Number of page(s) 9
DOI https://doi.org/10.1051/j3ea/20191013
Published online 18 octobre 2019
  1. K. Wu, "MHz-Through-THz (MTT) Challenges and Opportunities [President's Column]," in IEEE Microwave Magazine, vol. 17, no. 2, pp. 8–10 (2016). [Google Scholar]
  2. T. K. Sarkar, R. Mailloux, A. A. Oliner, M. Salazar-Palma and D. L. Sengupta, "The Evolution of Electromagnetic Waveguides: From Hollow Metallic Guides to Microwave Integrated Circuits," in History of Wireless, 1, Wiley-IEEE Press, pp. 543–566 (2016). [Google Scholar]
  3. K. C. Gupta, T. Itoh, and A. A. Oliner, “Microwave and RF education-past, present, and future,” IEEE Trans. Microw. Theory Tech., vol. 50, no. 3, pp. 1006–1014 (2002). [Google Scholar]
  4. T. M. Weller, P. G. Flikkema, L. P. Dunleavy, H. C. Gordon, and R. E. Henning, “Educating tomorrow’s RF/microwave engineer: A new undergraduate laboratory uniting circuit and system concepts,” in Proc. Microw. Symp. Dig., 1998 IEEE MTT-S Int., vol. 2, pp. 563–566 (1998). [Google Scholar]
  5. GIP-CNFM: Groupement d’Intérêt Public - Coordination Nationale pour la formation en Microélectronique et en nanotechnologies. Website: http://wwww.cnfm.fr. [Google Scholar]
  6. Marketsandmarkets.com, Publishing Date: January 2017, Report Code: AS 2320 [Google Scholar]
  7. C. Li, V. M. Lubecke, O. Boric-Lubecke and J. Lin, "A Review on Recent Advances in Doppler Radar Sensors for Noncontact Healthcare Monitoring," IEEE Trans. Microw. Theory Tech., vol. 61, no. 5, pp. 2046–2060 (2013). [Google Scholar]
  8. K. Haddadi, Mesure hyperfréquence des propriétés électromagnétiques de matériaux : 300 MHz à 300 GHz, in Techniques de l'Ingénieur, TI Sciences et Techniques, dossier R1117, 31 pages, Paris, France (2016). [Google Scholar]
  9. K. Haddadi and C. Loyez, "Millimeter-wave six-port IQ demodulator in 65 nm SOI CMOS technology," 2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings, Taipei, pp. 1–5 (2016) [Google Scholar]
  10. K. Haddadi and C. Loyez, "65 nm SOI CMOS 60 GHz passive mixer for six-port technology," 2016 IEEE Topical Conference on Wireless Sensors and Sensor Networks (WiSNet), Austin, TX, pp. 52–55 (2016). [Google Scholar]
  11. S. Lallemand, K. Haddadi and C. Loyez, "A review of the six-port technique for metrology applications," 2018 22nd International Microwave and Radar Conference (MIKON), Poznan, pp. 77–79 (2018). [Google Scholar]
  12. A. E. Fellahi, K. Haddadi, D. Glay and T. Lasri, "Multiport Reflectometer Based on Subtractive Mixing," in IEEE Sensors Journal, vol. 15, no. 9, pp. 4729–4730 (2015). [Google Scholar]
  13. K. Haddadi and T. Lasri, "Six-port technology for millimeter-wave radar and imaging applications," 2014 IEEE Topical Conference on Wireless Sensors and Sensor Networks (WiSNet), Newport Beach, CA, pp. 1–3 (2014). [Google Scholar]
  14. K. Haddadi and T. Lasri, "Formulation for Complete and Accurate Calibration of Six-Port Reflectometer," in IEEE Transactions on Microwave Theory and Techniques, vol. 60, no. 3, pp. 574–581 (2012). [Google Scholar]
  15. K. Haddadi, M. Wang, D. Glay and T. Lasri, "Ultra wide-band four-port reflectometer using only two quadratic detectors," 2008 IEEE MTT-S International Microwave Symposium Digest, Atlanta, GA, USA, 2008, pp. 379–382 (2008). [Google Scholar]
  16. IDEFI-FINMINA : Initiative d’Excellence - Formation Innovante en MIcroélectronique et Nanotechnologies, ANR-11-IDFI-0017. Website: http://www.cnfm.fr/VersionFrancaise/actualites/FINMINA.htm [Google Scholar]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.